The centre is well equipped with high-end PCs and networked to share a wide range of Linux-based and Window-based EDA tools, e.g. Cadence, Mentor Graphics, Synopsys, Agilent, Ansys, etc. for design and analysis of devices, circuits and systems. General test and measurement equipment such as digitizing scopes, function generators, signal generators, and spectrum analyzers, etc. are facilitated in the centre. The centre also houses a High Frequency Characterization Room that is equipped with a 12” Probe System and an Integrated Characterization and Analysis System. This is to facilitate on-wafer S- parameter RF/mm-wave device characterization from DC to 325-GHz, high frequency noise measurement from 0.3-GHz to 26.5-GHz and flicker noise measurement up to 40-MHz.